Speaker
Laura Grassellino
(Fermi National Accelerator Laboratory)
Description
The grinding process plays a crucial role in the fabrication of sub-components for 325 MHz spoke SRF cavities. During the forming and manufacturing stages, various defects can occur, which are addressed through grinding. This study aims to examine the effect of different grit sizes and explore how these sizes correlate with defect measurements. Optical microscopy and scanning electron microscopy (SEM) were employed to characterize the defects both before and after chemical treatment.
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Author
Laura Grassellino
(Fermi National Accelerator Laboratory)
Co-author
Mattia Parise
(Fermi National Accelerator Laboratory)