18–26 Sept 2025
Ito International Research Center
Asia/Tokyo timezone

Microstructural characterization of Nb3Sn thin films using 3D FIB tomography

MOP35
22 Sept 2025, 14:30
3h
Ito International Research Center

Ito International Research Center

Tokyo
Board: MOP35
Poster Presentation MC2: Fundamental SRF research and development Monday Poster Session

Speaker

Eric Viklund (High Energy Accelerator Research Organization)

Description

The accelerating gradient of Nb₃Sn superconducting radiofrequency (SRF) cavities is currently limited, and the underlying cause remains an open question in the field. One leading hypothesis attributes this limitation to the presence of tin-deficient regions within the Nb₃Sn coating, which can suppress the superheating field. Due to the relatively large coherence length of Nb₃Sn, defects near the surface may significantly interact with the RF field. However, these subsurface defects have proven difficult to characterize. In this contribution, we present an unprecedented level of detail into the structure and distribution of subsurface tin-deficient regions to better understand their influence on cavity performance. We employ 3D focused ion beam (FIB) tomography to analyze the subsurface microstructure of Nb₃Sn thin films. This technique enables three-dimensional reconstruction of both the tin distribution and the grain structure within the film. By correlating compositional variations with grain morphology, we gain insights into the formation mechanisms of tin-deficient regions and their potential role in limiting SRF cavity performance.

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Author

Eric Viklund (High Energy Accelerator Research Organization)

Co-authors

Prof. David N. Seidman (Northwestern University) Sam Posen (Fermi National Accelerator Laboratory)

Presentation materials

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