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Monitoring high-power heavy-ion slow extraction requires instrumentation capable of handling extreme intensity gradients. This paper reports on the design and performance of a beam diagnostic system developed to characterize $^{209}\text{Bi}^{31+}$ beams at $850\text{ MeV/u}$, covering a wide dynamic range from $10^{1}$ to $2 \times 10^{10} \text{ pps}$. To achieve this, a composite detector architecture was implemented, integrating plastic scintillators, Ionization Chambers (IC), and Secondary Electron Intensity Monitors (SEIM) for intensity measurements, alongside strip ionization chambers for profile monitoring. The study focuses on the calibration strategies and linearity management required to bridge overlapping sensitivity regions and mitigate saturation effects at high flux. Bench tests and beam experiments validate the system's high bandwidth and noise suppression, enabling the first detailed observation of the beam's 3D microstructure at these intensities. Results demonstrate that the instrumentation successfully maintains linear response across nine orders of magnitude, providing a robust tool for optimizing nanosecond and microsecond beam spill structures in high-intensity accelerators.
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