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Tong Liu (Institute of Modern Physics, Chinese Academy of Sciences)01/09/2026, 16:00MC01: Beam Charge and Current MonitorsContributed Oral Presentation
Monitoring high-power heavy-ion slow extraction requires instrumentation capable of handling extreme intensity gradients. This paper reports on the design and performance of a beam diagnostic system developed to characterize $^{209}\text{Bi}^{31+}$ beams at $850\text{ MeV/u}$, covering a wide dynamic range from $10^{1}$ to $2 \times 10^{10} \text{ pps}$. To achieve this, a composite detector...
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