Speaker
Description
RF direct sampling and processing of beam signals has always been the goal pursued in beam diagnostic systems. Now it’s time to make it happen. For the first time, a high-sensitivity RF direct sampling processor has been developed for C-band cavity pickups in SHINE/SXFEL. It redefines the beam diagnostic system. There is no longer a need for complex analog down-conversion modules in traditional cavity BPM/BAM systems. In addition, the processor can simultaneously meet the signal processing needs of different cavities with a center frequency below 6 GHz. Obviously, the RF direct sampling processor greatly reduces the complexity and costs of the system, shows great versatility. Meanwhile, compared to the down-conversion electronics, this processor demonstrates much higher sensitivity (twice) due to a significant reduction in analog components. The processor also has a huge advantage in other beam diagnostics because of its wide bandwidth and high sampling rate, such as bunch-by-bunch measurement and feedback system on synchrotron radiation facility. Now it's time to massively apply the RF direct sampling processor to promote the development of beam diagnostic technology.
Funding Agency
National Science Foundation of China (Grant No.12175293). Youth Innovation Promotion Association, CAS (Grant No. 2019290), Outstanding member of the Youth Innovation Promotion Association, CAS, SHINE
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