9–13 Sept 2024
Wanda Realm Beijing
Asia/Shanghai timezone
Pre-press Proceedings: https://proceedings.ihep.ac.cn/ibic2024/

Beam size measurement with gratings at BEPCII

TUBC4
10 Sept 2024, 12:10
20m
China Hall 2 (Auditorium)

China Hall 2

Auditorium

Contributed Oral Presentation MC4: Transverse Profile and Emittance Monitors TUB: Overview and Commissioning/Transverse Profile and Emittance Monitors

Speaker

Wan Zhang (Chinese Academy of Sciences)

Description

The vertical beam size measurement was carried out at BEPCII using a phase grating and an absorption grating based on the Talbot effect. Due to the partial coherence of the source, coherence length can be calculated by measuring the visibility decay of interferograms recorded at different distances behind gratings. The vertical beam size of 68.19±2μm was obtained based on the relationship between coherence length and source size. A comparison of the vertical emittance derived from grating Talbot method and synchrotron radiation visible light interferometer method was presented to evaluate the method. The vertical emittances from two methods are 1.41nm·rad and 1.40nm·rad respectively. The 0.1% difference indicates the grating Talbot method for beam size measurement is reliable. This technique has great potential in small beam size measurement in the fourth-generation synchrotron radiation light source, considering its small diffraction limitation and simple experimental setups.

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Primary author

Wan Zhang (Chinese Academy of Sciences)

Co-authors

Mr Dechong Zhu (Institute of High Energy Physics) Mr Jianshe Cao (Institute of High Energy Physics) Jun He (Institute of High Energy Physics) Mr Junhui Yue (Institute of High Energy Physics) Yanfeng Sui (Institute of High Energy Physics)

Presentation materials