9–13 Sept 2024
Wanda Realm Beijing
Asia/Shanghai timezone
Pre-press Proceedings: https://proceedings.ihep.ac.cn/ibic2024/

Development of high-resolution single-shot emittance diagnostics

WEBI2
11 Sept 2024, 11:20
30m
China Hall 2 (Auditorium)

China Hall 2

Auditorium

Invited Oral Presentation MC4: Transverse Profile and Emittance Monitors WEB: Transverse Profile and Emittance Monitors

Speaker

Ji-Gwang Hwang (Gangneung-Wonju National University)

Description

A pepper-pot diagnostic device was developed to accurately and robustly retrieve particle distribution in horizontal and vertical phase spaces by single-shot emittance measurements. Two masks that differ in both composition and manufacturing method were fabricated: one made of phosphor bronze by an optical lithography process and another made of stainless steel (SUS) by laser cutting. Scanning electron microscope (SEM) measurements of the two masks revealed that the former is superior in terms of regularity and shape
of the mask holes and is therefore more suitable to use. A new image-processing algorithm, cluster noise removal method, was developed which improves the resolution of the phase-space distribution measurements over traditional methods. The results show that the diagnostics can robustly and reliably retrieve the four-dimensional (4-D) phase-space distribution of ion beams with a single-shot measurement.

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Primary author

Ji-Gwang Hwang (Gangneung-Wonju National University)

Co-author

Garam Hahn (Pohang Accelerator Laboratory)

Presentation materials