IBIC2026 - 15th International Beam Instrumentation Conference

Session

MC04: Transverse Profile and Emittance Monitors

MOT

31 Aug 2026, 13:30

Rainbow Theatre (Whistler Conference Centre)

6. Betatron radiation as a dual diagnostic for electrons and photons in plasma accelerators (MORT04)

Alessandro Curcio (Sapienza University of Rome)

31/08/2026, 13:30

MC04: Transverse Profile and Emittance Monitors

Invited Oral Presentation

Betatron radiation generated by relativistic electrons oscillating in plasma wakefields constitutes a powerful, non-invasive diagnostic for both electron beams and the emitted photon radiation in plasma accelerators.
The spectral, angular, and statistical features of the radiation encode key information about electron dynamics, enabling single-shot reconstruction of electron beam parameters,...

141. Large-diameter carbon nanotube fiber for H-/proton beam diagnostics: fabrication, test and implementation at CSNS accelerator (MORT05)

chunjie xie (Institute of High Energy Physics)

31/08/2026, 14:00

MC04: Transverse Profile and Emittance Monitors

Contributed Oral Presentation

Carbon nanotube fibers are a promising alternative to traditional materials used in accelerator beam diagnostics due to their high thermal conductivity, mechanical strength, and radiation resistance. A novel large-diameter carbon nanotube (CNT) fiber has been recently fabricated and produced based upon vacuum annealing purification. We have optimized the fabrication process to produce...

62. Polychromatic synchrotron interferometer for HALF: single-shot two-dimensional beam profiling (MORT06)

Xinru Gao (University of Science and Technology of China)

31/08/2026, 14:20

MC04: Transverse Profile and Emittance Monitors

Contributed Oral Presentation

This paper presents a novel polychromatic synchrotron interferometer specifically designed to meet the stringent single-shot, two-dimensional beam diagnostic requirements of fourth-generation diffraction-limited light sources like the Hefei Advanced Light Facility (HALF). The system overcomes the limitations of conventional sequential and single-projection methods by enabling complete...