Speaker
Description
This paper presents a novel polychromatic synchrotron interferometer specifically designed to meet the stringent single-shot, two-dimensional beam diagnostic requirements of fourth-generation diffraction-limited light sources like the Hefei Advanced Light Facility (HALF). The system overcomes the limitations of conventional sequential and single-projection methods by enabling complete transverse beam profile reconstruction from a single exposure. Its core innovation utilizes a color CCD's Bayer filter array to simultaneously record broadband interference fringes across red, green, and blue channels, each corresponding to a distinct projection angle of the beam via a tailored multi-slit mask. This provides parallel spatial coherence measurements at multiple effective spatial frequencies and orientations. To accurately extract beam parameters from the polychromatic signal, a broadband visibility integral inversion method is developed, accounting for the source spectrum and system response. The instrument has been successfully validated through beam experiments at the Hefei Light Source (HLS-II). Using a multi-slit mask with color filters, the system demonstrated single-shot acquisition of beam projections at 0°, 45°, and 90°, from which the full two-dimensional transverse profile was reconstructed. This work provides a validated, high-throughput, and non-invasive diagnostic solution for real-time beam characterization at HALF and other ultra-low-emittance facilities.
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| Supervisor's name | Yongbin Leng |
| Supervisor's email | lengyb@ustc.edu.cn |
| Paper submission software | LATeX |