Conveners
FRA: Transverse Profile and Emittance Monitors: FRAT (Tutorial)
- Kenichirou Satou (High Energy Accelerator Research Organization)
FRA: Transverse Profile and Emittance Monitors: FRAI (Invited Oral)
- Kenichirou Satou (High Energy Accelerator Research Organization)
Thin objects in the form of wires, foils or strips are often used as targets in various instruments that measure beam parameters or for other purposes. They usually cause only small beam perturbations and suffer from relatively low temperature increases. The beam induces the emission of secondary electrons, which are usually the source of the measured signal. In high brightness beams, the...
The development of a sub-micrometer spatial resolution and minimal invasive wire scanner has been pursued at the Paul Scherrer Institute with a twofold aim. Providing for on-line monitoring of the SwissFEL electron beam transverse size and emittance during lasing operation while paving, at the same time, the way for the production of a new generation of customisable wire scanners, suitable for...
