9–13 Sept 2024
Wanda Realm Beijing
Asia/Shanghai timezone
Early Registration Deadline: July 1, 2024(Monday)

The bunch length monitor based on CSR in SXFEL

12 Sept 2024, 16:00
1h 30m
China Hall 3

China Hall 3

Poster Presentation MC5: Longitudinal Diagnostics and Synchronization THP: Thursday Poster Session

Speaker

Lianfa Hua (Shanghai Synchrotron Radiation Facility)

Description

Monitoring the beam length and maintaining stability during operation is crucial for Free Electron Laser (FEL) user facilities. A monitor based on Coherent Synchrotron Radiation (CSR) is an ideal candidate, and it has been successfully developed at the Shanghai X-ray Free Electron Laser (SXFEL). This article presents the basic principles, system configuration, and experimental results. The results show that the monitor is capable of measuring the bunch length within a range of 0.6 ps to 1.4 ps, achieving a precision better than 10%.

I have read and accept the Privacy Policy Statement Yes

Primary author

Lianfa Hua (Shanghai Synchrotron Radiation Facility)

Co-authors

Ning Zhang (Shanghai Synchrotron Radiation Facility) Yongbin Leng (University of Science and Technology of China) Zhichu Chen (Shanghai Synchrotron Radiation Facility)

Presentation materials

There are no materials yet.