Speaker
Description
Accurate measurement of flux rate is essential in heavy-ion single event effects tests, but it presents significant challenges for monitoring low energy (5~10MeV/u) and low intensity (less than 1E6/s) heavy-ion beams. In this paper, we propose a novel detector that enables real-time monitoring of flux rate by simultaneously measuring the beam intensity and profile using secondary electrons on both the front and back surfaces of thin films. The confinement of secondary electrons through electric and magnetic fields is achieved, with CST simulation conducted to validate the method. This approach offers several advantages over conventional methods, including high spatial and temporal resolution, reduced mass thickness, and multi-parameter measurement capability. Our research expands the application potential of such detectors while providing technical support for radiation measurement in single event effects tests.
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