9–13 Sept 2024
Wanda Realm Beijing
Asia/Shanghai timezone
Pre-press Proceedings: https://proceedings.ihep.ac.cn/ibic2024/

DCCT noise and beam lifetime measurement

THP13
12 Sept 2024, 16:00
1h 30m
China Hall 3

China Hall 3

Poster Presentation MC1: Beam Charge and Current Monitors THP: Thursday Poster Session

Speaker

Gero Kube (Deutsches Elektronen-Synchrotron)

Description

Beam lifetime measurements are an important tool to characterize the key storage ring and machine performance parameters. They are usually derived from the dc current transformer (DCCT) data, and their accuracy depends on DCCT noise and data duration period. However, accurate dc current and fast lifetime determination are in contradiction and have to be balanced carefully. In this contribution, a model is presented which relates the relative accuracy in lifetime determination and the DCCT noise with the acquisition time. For the PETRA IV project at DESY (Hamburg, Germany) which aims to upgrade the present PETRA III synchrotron into an ultra low-emittance source, according to this model a lifetime determination to the level of 1% should be possible within 5-6 s acquisition time.

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Primary author

Gero Kube (Deutsches Elektronen-Synchrotron)

Co-authors

Klaus Knaack (Deutsches Elektronen-Synchrotron) Matthias Werner (Deutsches Elektronen-Synchrotron)

Presentation materials

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