Speaker
Mr
Jian Dong
(Shanghai Synchrotron Radiation Facility)
Description
The Shanghai High repetition rate XFEL and Extreme light facility (SHINE) accelerates electrons to 8GeV with a high repetition rate of up to 1MHz. For the transverse beam profile measurement in the high energy sections wire scanner is used as an essential part of the accelerator diagnostic system, providing the tool to measure small beam size in an almost non-destructive manner. The prototype of the data acquisition and processing platform of wire scanner is designed and installed at the Shanghai soft X-ray Free Electron Laser (SXFEL) for verification. The experimental results show that the platform can be used for the SHINE.
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Primary author
Mr
Jian Dong
(Shanghai Synchrotron Radiation Facility)
Co-authors
Fangzhou Chen
(Shanghai Synchrotron Radiation Facility)
Jie Chen
(Shanghai Advanced Research Institute)
Mr
Luyang Yu
(Shanghai Synchrotron Radiation Facility)
Mr
Renxian Yuan
(Shanghai Synchrotron Radiation Facility)
Shanshan Cao
(Shanghai Advanced Research Institute)
