Speaker
Description
Free‑electron lasers rely on extremely high‑quality, ultrafast electron bunches. Among various diagnostic tools, THz detectors play an essential role in longitudinal diagnostics of electron bunches, such as during the bunch compression process. To address both the existing and future machines, we are developing ultra-broadband THz detectors. Here, we present the development of Schottky diodes and field-effect transistor (FET) detectors operating at room temperature for electron-beam diagnostics. The four aspects of newly developed detectors are: (i) frequency coverage: ultra-broadband single-pixel THz detectors based on both technologies (ii) ultra-wide band IF bandwidth up to ~50 GHz: this enables single shot detection of ps-scale THz pulses with response time in ps range (overcome the pile up issue faced by its counterparts), (iii) experimentally realized bunch compression monitoring capability from single-digit pC to ~ 220 pC: this is essential for precise machine settings for desired beam parameter output, and (iv) Radiation hardness examination of the developed detectors for their smooth operation at accelerator facilities. These detectors are tested at the ELBE facility and can be implemented at other FEL facilities.
Funding Agency
The German Federal Ministry of Research, Technology and Space (BMFTR) supports the work under contract no. 05K22RO1 (at THM, Friedberg) and 05K22RD1 (at TU Darmstadt).
Footnotes
[] R. Yadav, PhD Thesis, TU Darmstadt, April 2026.
[] R. Yadav, et al., Sensors 23, 3469, March 2023.
[] R. Yadav, et al., Opt. Express 32, 43407, Nov 2024.
[**] R. Yadav, et al., IEEE T-TST, April 2026.
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