30 August 2026 to 3 September 2026
Whistler Conference Centre
Canada/Pacific timezone
Poster ONLY abstracts are still being accepted -- contact IBIC2026@triumf.ca | Registration is Open

Optimization of the ion trap for secondary electron suppression in the CSNS RCS IPM

MOP026
31 Aug 2026, 16:40
2h
Ballroom C (Whistler Conference Centre)

Ballroom C

Whistler Conference Centre

Poster Presentation MC04: Transverse Profile and Emittance Monitors Monday Poster Session 1

Speakers

Renjun Yang (Institute of High Energy Physics) Yuliang Xiao (Institute of High Energy Physics)

Description

Non-destructive beam profile monitoring is critical for high-intensity proton accelerators like the CSNS Rapid Cycling Synchrotron (RCS). While the Ionization Profile Monitor (IPM) typically reconstructs beam profiles by collecting ionization electrons from residual gas, a key challenge arises from positive ions drifting toward the field cage. Their impacts generate secondary electrons that propagate back to the detector, causing significant beam profile distortion. To mitigate this, an ion trap with a specifically designed slit opening was implemented. This structure selectively allows positive ions to pass through the slit and be confined on the rear side, while effectively suppressing secondary electrons from reaching the sensor. A comprehensive simulation study was performed to optimize the ion trap geometry and performance for the IPM. This paper presents the optimization process and results for the ion trap implemented in the CSNS RCS IPM.

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Author

Yuliang Xiao (Institute of High Energy Physics)

Co-authors

Mengyu Liu (Chinese Academy of Sciences) Muhammad Abdul Rehman (Institute of High Energy Physics) Renjun Yang (Institute of High Energy Physics)

Presentation materials

There are no materials yet.