IBIC2026 - 15th International Beam Instrumentation Conference

Development of a novel bunch-by-bunch beam size monitor using silicon strip sensors and the RFSoC architecture

WEP016

2 Sept 2026, 16:00

2h

Ballroom C (Whistler Conference Centre)

Poster Presentation MC07: Data Acquisition and Processing Platforms Wednesday Poster Session 3

Speaker

Gaku Mitsuka (High Energy Accelerator Research Organization)

Description

This presentation will discuss the development of a novel bunch-by-bunch beam size monitor (SiXRM) employing silicon strip sensors and an RFSoC-based readout architecture. SiXRM is an ultrafast X-ray beam size monitor developed at the SuperKEKB electron-positron collider, and its development has been ongoing for the past ten years. The existing system uses a 2.7 Gsps ASIC for AD conversion of signals from 42 channels of the silicon strip sensors. During the 2025-2026 SuperKEKB runs, we observed beam-size fluctuations in each bunch during beam collisions, as well as their betatron-tune dependence. The main features of the next-generation SiXRM currently under development are: 1) protecting the digital readout electronics from X-ray exposure by connecting the analog and digital electronics with a differential cable several meters long; 2) the RFSoC integrates fast ADCs, enabling continuous high-speed readout of multiple channels; and 3) a large-scale Zynq FPGA within the RFSoC makes it possible to implement ML-based beam size anomaly detection, thereby enabling early abort of unstable beams. This presentation will focus on these features and discuss the development progress of the next-generation SiXRM.