Speaker
Description
We have developed a beam monitoring diagnostic system based on two different proprietary thin-scintillator materials and ultra-fast optics for measurement of transverse beam size, beam profile and particle flux density in “real-time” with a wide dynamic range of approximately seven (7) orders-of-magnitude down to single-ions. It has attracted particular attention at facilities where fast beam imaging, analysis and tuning are at a premium, especially at low-particle fluence rates down to single-particles. Two types of proprietary scintillators are used: 1) a semi-crystalline polymer material (PM) with a water-equivalent thickness of between ~2 to 250 microns, yielding stronger signals per unit thickness than tested PVT-based plastic scintillators; 2) a hybrid material (HM) with a water-equivalent thickness of ~300-500 microns, yielding order-of-magnitude larger signals per unit thickness than single crystal CsI(Tl), producing sharp beam images with minimal internal reflections. These scintillators are non-hygroscopic with HM being especially radiation damage resistant. The first diagnostic system was sold and installed at FRIB on the ReA3-SECAR beamline and successfully tested using a 4.5 MeV/u beam of mixed and “pure” Cl-35 and N-14 ions over a range from <10 to 10$^7$ pps. A first-generation prototype system had been previously tested using a 2.7 MeV/u ion-beam of Kr-86 and demonstrated a single-particle spatial resolution of ~30 microns.
Funding Agency
U.S. Department of Energy, Office of Science and Nuclear Physics
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