30 August 2026 to 3 September 2026
Whistler Conference Centre
Canada/Pacific timezone
Poster ONLY abstracts are still being accepted -- contact IBIC2026@triumf.ca | Registration is Open

An ionization profile monitor for transverse beam profile measurements at GSI/FAIR

MOP006
31 Aug 2026, 16:40
2h
Ballroom C (Whistler Conference Centre)

Ballroom C

Whistler Conference Centre

Poster Presentation MC04: Transverse Profile and Emittance Monitors Monday Poster Session 1

Speaker

Rok Hrovatin (Cosylab)

Description

A control and acquisition system for ionization profile monitor (IPM) stations at GSI/FAIR has been implemented and deployed, providing real-time, simultaneous transverse beam characterization in both planes without disturbing the beam. Built on FESA (Front-End Software Architecture), the system uses dedicated classes to manage the cameras, high-voltage control, and digital I/O. Each transverse plane uses an MCP in a chevron configuration with an attached phosphor screen, imaged by a global-shutter GigE camera. Per-frame image correction and noise filtering compensate for detector non-uniformity and degradation while masking defective pixels. Configurable estimators then extract the beam position, beam width, and profile integral from the resulting profiles. Automatic high-voltage reduction protects the detector under overload conditions. Acquisition is synchronized with the accelerator cycle via a White Rabbit timing receiver, supporting frame rates of up to 300 fps. Acquired images and computed profiles are saved per machine cycle in an XML-based format. A JavaFX operator interface provides guided setup, live visualization with historical data overlay, and expert configuration options. Designed to support multiple IPM stations at GSI/FAIR, the system is currently in operational use at SIS18 (heavy-ion synchrotron) and ESR (Experimental Storage Ring).

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Author

Uroš Bajc (Cosylab)

Co-author

Rok Hrovatin (Cosylab)

Presentation materials

There are no materials yet.