30 August 2026 to 3 September 2026
Whistler Conference Centre
Canada/Pacific timezone
Poster ONLY abstracts are still being accepted -- contact IBIC2026@triumf.ca | Registration is Open

Design of a Vis–UV diagnostic beamline for transverse beam size measurement at SPS-II

MOP047
31 Aug 2026, 16:40
2h
Ballroom C (Whistler Conference Centre)

Ballroom C

Whistler Conference Centre

Poster Presentation MC04: Transverse Profile and Emittance Monitors Monday Poster Session 1

Speaker

Porntip Sudmuang (Synchrotron Light Research Institute)

Description

A visible–ultraviolet (Vis–UV) diagnostic beamline is being developed for Siam Photon Source II (SPS-II) to enable precise transverse electron beam size measurements. The vertical (π) polarization technique using the dipole radiation has been selected to enable vertical beam size measurements below 10 µm. Given the limited space available in the double-triple bend achromat (DTBA) lattice, a removable first mirror has been designed for installation inside the dipole vacuum chamber. This introduces significant engineering challenges in extracting diagnostic photons while managing the substantial thermal load from the dipole radiation fan, without inducing flow-related vibration or optical surface deformation. This paper presents the conceptual design of the first mirror system, associated thermal and mechanical considerations, and the optical layout of the Vis–UV diagnostic beamline. Detailed beamline modeling and synchrotron radiation calculations performed using Synchrotron Radiation Workshop (SRW) are also presented to evaluate beam transport and diagnostic performance.

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Authors

Buradsakon Pongtippitak (Synchrotron Light Research Institute) Chanan Euaruksakul (Synchrotron Light Research Institute) Porntip Sudmuang (Synchrotron Light Research Institute) Sukho Kongtawong (Synchrotron Light Research Institute) Thanapong Phimsen (Synchrotron Light Research Institute)

Presentation materials

There are no materials yet.