Speaker
Description
X-ray beam position monitors (XBPMs) are an indispensable tool for determining the position of the white beam in beamline front-ends at synchrotron light sources. White beam XBPMs at Diamond Light Source typically use four tungsten blades which intercept the tails of the transverse beam profile in order to not disrupt user beam. The measured currents from the four blades are converted to a beam position using the difference-over-sum calculation and a scaling factor. This scaling factor is dependent on the transverse profile of the X-ray beam, and thus reliant on the gap of the insertion device providing the X-rays to the front-end. A method for determining the scaling factor using correlation of the intrinsic electron beam position monitor (EBPM) noise with XBPM measurements has been presented previously. This approach introduces error when there is a rotation of the XBPM measurements with respect to the EBPM measurements. In order to resolve this, an affine transformation between the EBPM and XBPM measurements has been tested, and the scaling factors extracted. The affine transformation can also be used to calculate rotation or skew factors. Measurements of these scaling and skew factors are presented along with interpretations.
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