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With the ever-increasing performance of ADC, digital electronics systems based on direct RF sampling have become capable of serving many areas of beam instrumentation. One of the most significant applications is the electronics for CBPM (Cavity Beam Position Monitor) and BAM (Beam Arrival Monitor) pickups, as the signals generated by these pickups are high-frequency signals above 3 GHz. By adopting the direct RF sampling scheme, the complexity of the RF front-end can be greatly reduced, and the high cost of local oscillator (LO) design is also saved.
This paper presents the test results of our direct RF sampling electronics on the CBPM and BAM pickups at the Dalian Advanced Light Source (DALS). The core ADC chip is the XCZU47DR model from the RFSoC family. Under actual beam conditions, the relative transverse position resolution achieved is 0.027% @ 100 pC, and the time-of-arrival resolution is approximately 26 fs@100pc, well meeting the specifications of the pickups.
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