30 August 2026 to 3 September 2026
Whistler Conference Centre
Canada/Pacific timezone
Poster ONLY abstracts are still being accepted -- contact IBIC2026@triumf.ca | Registration is Open

Enhanced reconstruction method employing machine learning for electro-optic sampling of shaped high energy electron beams

TUP032
1 Sept 2026, 16:20
2h
Ballroom C (Whistler Conference Centre)

Ballroom C

Whistler Conference Centre

Poster Presentation MC05: Longitudinal Diagnostics and Synchronization Tuesday Poster Session 2

Speaker

Spencer Kelham (Northern Illinois University)

Description

Electro-optic sampling (EOS) is an attractive technique for non-destructive measurement of electron bunch profiles. Its importance continues to grow for next generation high-energy accelerators, where intercepting diagnostics are no longer viable. In EOS, the measured signal corresponds to the phase retardance, rather than a direct measurement of the electric field. The electro-optic (EO) response acts like a finite-bandwidth transfer function, which attenuates high-frequency components and makes the reconstruction ill-conditioned. In this work, we investigate machine learning (ML) as a data-driven approach to improve reconstruction of the underlying THz pulse from EOS measurements. While the fundamental information content remains constrained by the EO response, the ML framework leverages prior knowledge of physically plausible pulse structures to stabilize the inversion.

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Supervisor's name Gwanghui Ha
Supervisor's email gha@niu.edu
Paper submission software LATeX

Author

Spencer Kelham (Northern Illinois University)

Co-author

Gwanghui Ha (Northern Illinois University)

Presentation materials

There are no materials yet.