Session

WEIAC WGE invited oral

WEIAC
Oct 22, 2025, 8:30 AM
Room C (Conference Center)

Room C

Conference Center

Conveners

WEIAC WGE invited oral: WEIAC

  • Kenichirou Satou (High Energy Accelerator Research Organization)

Presentation materials

There are no materials yet.

Takeshi Nakamura (High Energy Accelerator Research Organization)
10/22/25, 8:30 AM
WGE: Beam Instrumentation, beam Interaction and AI technology
Invited Oral Presentation

Transverse feedback suppresses beam instabilities that are prominent in high-intensity beams and is essential for their stable acceleration. At J-PARC, a digital signal processor is being developed for the transverse feedback systems in the Main Ring and RCS proton synchrotrons. The processor uses an RFSoC, an FPGA with integrated ADCs and DACs. It segments 100-ns-long bunches at a sampling...

Mr Hong Ming Xie (Institute of Modern Physics, Chinese Academy of Sciences)
10/22/25, 9:00 AM
WGE: Beam Instrumentation, beam Interaction and AI technology
Invited Oral Presentation

updating

Cyrille Thomas (European Spallation Source)
10/22/25, 9:30 AM
WGE: Beam Instrumentation, beam Interaction and AI technology
Invited Oral Presentation

Optical imaging systems have been designed and installed upstream of the European Spallation Source (ESS) Tuning Dump (TD) and the ESS spallation Target to provide machine protection and beam tuning support functionalities. The ESS accelerator delivers a high-power, low-emittance proton beam, which must always be controlled. In the TD, the optical imaging systems remotely view the beam profile...

Hao Hu (Huazhong University of Science and Technology)
10/22/25, 10:00 AM
WGE: Beam Instrumentation, beam Interaction and AI technology
Invited Oral Presentation

Electron beam injectors, critical to light sources and ultrafast diffraction systems, need precise transverse phase space diagnostics for optimizing beam quality. The slit-scanning method, often combined with computed tomography (CT), is common for non-presumptive phase space reconstruction but has resolution limits due to sparse sampling and constraints of devices/experimental conditions.This...

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