19–24 May 2024
Music City Center
US/Central timezone

Data processing for profile monitor of HEPS linac

WEPR64
22 May 2024, 16:00
2h
Rock 'n Roll (MCC Exhibit Hall A)

Rock 'n Roll

MCC Exhibit Hall A

Poster Presentation MC5.D11 Code Developments and Simulation Techniques Wednesday Poster Session

Speaker

Yi Jiao (Institute of High Energy Physics)

Description

Profile Monitor (PR) is used to observe and measure the beam profile in the Linac and transport line of the High Energy Phone Source (HEPS). To obtain more precise results, we implemented several widely used fitting algorithms in the framework Pyapas. We carried out detailed testing and comparison of these fitting methods based on simulated results and actual measurement data, respectively, and found the most suitable method under different beam conditions. These methods have been used in various applications for HEPS commissioning, including emittance measurement, energy and energy spread measurement, and RF phase scan. This paper provides an introduction to these algorithms. Subsequently, taking the emittance measurement application as an example, the results of error analyses are presented.

Region represented Asia
Paper preparation format Word

Primary author

Yaliang Zhao (Institute of High Energy Physics)

Co-authors

Dr Cai Meng (Chinese Academy of Sciences) Xiaohan Lu (Institute of High Energy Physics) Yi Jiao (Institute of High Energy Physics)

Presentation materials

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