19–24 May 2024
Music City Center
US/Central timezone

Real-time measurements of the RF-path of an electro-optical bunch arrival-time monitor with integrated planar pickup-structure with low-charge electron beams at ELBE

WEPG82
22 May 2024, 16:00
2h
Bluegrass (MCC Exhibit Hall A)

Bluegrass

MCC Exhibit Hall A

Poster Presentation MC6.T03 Beam Diagnostics and Instrumentation Wednesday Poster Session

Speaker

Mr Bernhard Scheible (Technische Hochschule Mittelhessen)

Description

Ultra-low-charge operation of free-electron lasers down to 1 pC or even lower, requires adequate diagnostics for both, the users and the operators. For the electro-optical bunch-arrival time monitor a fundamental design update is necessary to yield single-digit fs precision with such low charges. In 2023 a vacuum sealed demonstrator for a novel pickup structure with integrated combination network on a printed circuit board was built for operation of the free-electron laser ELBE at HZDR. Together with a new low-pi-voltage ultra-wideband traveling wave electro-optical modulator, this concept reaches an estimated theoretical jitter charge product of 9 fs pC. As a proof-of-concept measurements done at ELBE with the pickup demonstrator were carried out: In this contribution we analyze the effects of the variation of different beam properties, e.g., charge and position.

Funding Agency

This work is supported by the German Federal Ministry of Education and Research (BMBF) under Contract No. 05K19RO1 and 05K22RO2.

Region represented Europe
Paper preparation format LaTeX

Primary author

Mr Bernhard Scheible (Technische Hochschule Mittelhessen)

Co-authors

Prof. Andreas Penirschke (Technische Hochschule Mittelhessen) Herbert De Gersem (Technische Universität Darmstadt) Holger Schlarb (Deutsches Elektronen-Synchrotron) Marie Kristin Czwalinna (Deutsches Elektronen-Synchrotron) Michael Kuntzsch (Helmholtz-Zentrum Dresden-Rossendorf) Nisamol Nazer (Deutsches Elektronen-Synchrotron) Wolfgang Ackermann (Technische Universität Darmstadt)

Presentation materials

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