19–24 May 2024
Music City Center
US/Central timezone

R&D of EOTD bunch length monitor for SXFEL

WEPG80
22 May 2024, 16:00
2h
Bluegrass (MCC Exhibit Hall A)

Bluegrass

MCC Exhibit Hall A

Poster Presentation MC6.T03 Beam Diagnostics and Instrumentation Wednesday Poster Session

Speaker

Lianfa Hua (Shanghai Synchrotron Radiation Facility)

Description

As one of online single-shot and non-destructive absolute measure methods with high resolution, Electro-Optical (EO) techniques have been widely utilized in Free Electron Laser to measure the longitudinal bunch profile. A bunch length monitor with 100 fs resolution is required for Shanghai Soft X-ray FEL (SXFEL) facility. The solution based on Electro-Optical Temporal Decoding (EOTD) method has been developed and tested during the past year. This paper will present the whole design according to SXFEL condition and its test results.

Region represented Asia

Primary author

Lianfa Hua (Shanghai Synchrotron Radiation Facility)

Co-authors

Xiaoqing Liu (Shanghai Advanced Research Institute) Renxian Yuan (Shanghai Institute of Applied Physics) Luyang Yu (Shanghai Institute of Applied Physics) Yongbin Leng (University of Science and Technology of China)

Presentation materials

There are no materials yet.