Speaker
Yuechao Yu
(Shanghai Advanced Research Institute)
Description
T-mapping diagnostic system is an indirect method to detect the internal surface of superconducting cavity during vertical testing. When superconducting cavity is powered, T-Mapping can detect the thermal instability and thermal collapse caused by defects. The goal of the project is to develop temperature detection devices that are highly accurate and easy to install. The development of the equipment plays a supporting role in the production of superconducting cavity, and can intuitive feedback the defects in the machining assembly, which is conducive to the improvement of the processing technology.
| Region represented | Asia |
|---|---|
| Paper preparation format | Word |
Primary author
Yuechao Yu
(Shanghai Advanced Research Institute)
Co-authors
H. Jiang
(Shanghai Advanced Research Institute)
Kai Xu
(Shanghai Advanced Research Institute)
Qiang Chang
(Shanghai Institute of Applied Physics)
ShenJie Zhao
(Shanghai Institute of Applied Physics)
X Liu
(Shanghai Advanced Research Institute)
Xiaohan Ouyang
(Shanghai Advanced Research Institute)
