Speaker
Xi Yang
(Brookhaven National Laboratory)
Description
Ultrafast electron microscopy (UEM) can be used to probe
ultrasmall (nm scale) and ultrafast (fs scale) world. At the
fundamental level, atomic potentials determine the elastic
electron scattering in UEMs. Here we calculate the first
correction term analytically for elastic scattering of electrons
by atoms in the weak phase object approximation. Its effect
varies with atom types and electron energies and may be
non-negligible for electron microscopy images.
Funding Agency
Brookhaven National Laboratory Directed Research and Development Program
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Primary author
Ganesh Tiwari
(Brookhaven National Laboratory)
Co-authors
Victor Smaluk
(Brookhaven National Laboratory)
Xi Yang
(Brookhaven National Laboratory)
