7–12 May 2023
Venice, Italy
Europe/Zurich timezone

R&D of EOTD bunch length monitor for SXFEL

THPL184
11 May 2023, 16:30
2h
Sala Laguna

Sala Laguna

Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Thursday Poster Session

Speaker

Lianfa Hua (Shanghai Synchrotron Radiation Facility)

Description

As one of on-line single-shot and non-destructive absolute measure methods with high resolution, Electro-Optical (EO) techniques have been wildly utilized in Free Electron Laser to measure the longitudinal bunch profile. A bunch length monitor with 100 fs resolution is required for Shanghai Soft X-ray FEL (SXFEL) facility. The solution based on Electro-Optical Temporal Decoding (EOTD) method has been developed and tested during the past year. This paper will present the whole design according to SXFEL condition and its first test results.

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Primary author

Lianfa Hua (Shanghai Synchrotron Radiation Facility)

Presentation materials

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