16–21 Aug 2026
Daejeon Convention Center
Asia/Seoul timezone

Application of Bunch-by-Bunch Diagnostic Technology in HiFEL

Not scheduled
2h
Daejeon Convention Center

Daejeon Convention Center

107 Expo-ro, Yuseong-gu, Daejeon (34125) South Korea
Poster Presentation MC4.A01: Beam diagnostics Poster Session

Speaker

Dr Youming Deng (University of Science and Technology of China)

Description

The Hefei Infrared Free Electron Laser (HiFEL) is a user facility built by the University of Science and Technology of China, dedicated to energy chemistry research. The facility operates in a special mode: a macro-pulse with a variable repetition rate of 1 Hz to 10 Hz contains micro-pulses with variable repetition rates of 29.75/59.5/119/238 MHz, and the macro-pulse width is on the order of microseconds. Recently, the beam position measurement system of the facility has been upgraded to a diagnostic system with bunch-by-bunch resolution, enabling precise measurement of the transverse position, longitudinal phase, and charge of each micro-pulse. Based on bunch-by-bunch diagnostic technology, parameters such as the evolution of micro-pulses at different positions and times, as well as energy differences in the bending section, have been monitored and analyzed. This provides new tools and perspectives for operational beam tuning.

Funding Agency

Work supported by Large-Scale Scientific Facility Renovation and Upgrade Project of the Chinese Academy of Sciences -“Universal SignalProcessing Platform for Accelerator Beam Measurement and Control”.

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Author

Dr Youming Deng (University of Science and Technology of China)

Co-authors

Dr Daoyuan Wang (University of Science and Technology of China) Xing Yang (University of Science and Technology of China) Yongbin Leng (University of Science and Technology of China)

Presentation materials

There are no materials yet.