16–21 Aug 2026
Daejeon Convention Center
Asia/Seoul timezone

An Ionization Profile Monitor for Transverse Beam Profile Measurements at GSI/FAIR

Not scheduled
2h
Daejeon Convention Center

Daejeon Convention Center

107 Expo-ro, Yuseong-gu, Daejeon (34125) South Korea
Poster Presentation MC4.A01: Beam diagnostics Poster Session

Speaker

Ziga Kroflic (Cosylab)

Description

A control and acquisition system for ionization profile monitor (IPM) stations at GSI/FAIR has been implemented and deployed, providing real-time, simultaneous transverse beam characterization in both planes without disturbing the beam. Built on FESA (Front-End Software Architecture), the system uses dedicated classes to manage the cameras, high-voltage control, and digital I/O. Image correction and noise filtering are applied before the beam position, beam width, and profile integral are extracted from the resulting profiles. Automatic high-voltage reduction protects the detector under overload conditions. Acquisition is synchronized with the accelerator cycle via a White Rabbit timing receiver, supporting frame rates of up to 300 fps. Acquired images and computed profiles are saved per machine cycle in an XML-based format. A JavaFX operator interface provides guided setup, live visualization with historical data overlay, and expert configuration options. Designed to support multiple IPM stations at GSI/FAIR, the system is currently in operational use at SIS18 (heavy-ion synchrotron) and ESR (Experimental Storage Ring).

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Author

Mr Uroš Bajc (Cosylab)

Co-author

Ziga Kroflic (Cosylab)

Presentation materials

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