16–21 Aug 2026
Daejeon Convention Center
Asia/Seoul timezone

Intrabeam Scattering and 6D Brightness: Modelling, Measurement, and the Road to a Brighter SwissFEL electron source

Not scheduled
20m
Daejeon Convention Center

Daejeon Convention Center

107 Expo-ro, Yuseong-gu, Daejeon (34125) South Korea
Invited Talk (Invitation Only) MC1.A02 Electron and ion sources, guns, photo injectors, charge breeders Invited Talks

Speaker

Thomas Lucas (Paul Scherrer Institute)

Description

Intrabeam scattering (IBS) in the SwissFEL injector has emerged as a critical performance-limiting phenomenon, manifesting as a significantly larger slice energy spread than previously anticipated. By combining detailed numerical simulations with a newly developed analytical model, we achieve excellent agreement with experimentally measured slice energy spreads, validating our approach. These results naturally prompt the question of how IBS-induced degradation can be mitigated, both in future SwissFEL operation and in next-generation facilities. Leveraging the insights gained from our study, we identify key design principles for X-ray free-electron laser (XFEL) injectors aimed at suppressing slice energy spread growth. Furthermore, guided by this improved understanding, we propose and evaluate novel operational schemes for the electron source that enhance XFEL performance in the presence of IBS.

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Author

Thomas Lucas (Paul Scherrer Institute)

Co-authors

Ms Alejandra Ocampo (Paul Scherrer Institute) Eduard Prat (Paul Scherrer Institute) Erion Gjonaj (Technical University of Darmstadt) Paolo Craievich (Paul Scherrer Institute) Sven Reiche (Paul Scherrer Institute)

Presentation materials

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