Speaker
Description
Modern electronic systems are required to provide various degrees of radiation hardness against performance and lifespan degradation due to the natural environment, man-made radiation sources, and their mission or use case. Solar coronal mass ejections (CME) and galactic cosmic rays (GCR) are two sources of naturally-occurring radiation fields with sufficient flux and energy to disrupt sensitive electronic systems. Single event effects (SEE) are a primary cause of failures in electronics due to energy deposited by high energy ions. Accelerator-based sources of ion irradiation are now commonly used to explore device interactions with ions of 10’s MeV/AMU kinetic energies. With the evolution of requirements from the electronics community to ions in the 100’s MeV/AMU to GeV/AMU energy regime, new accelerator architectures are being considered. Linac-based facilities offer several advantages over other architectures. In this talk we will discuss the requirements and opportunities for accelerator-based radiation sources for SEE testing, and the tradeoffs between various architectures. Current and proposed linac-based facilities will be presented and discussed.
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