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Description
Insulation imperfections in high-voltage capacitors can trigger partial discharge (PD) activity, driving degradation and ultimately causing failure. This study investigates the relative assessment of PD activity in high-voltage capacitors, combining experimental PD measurements on two distinct capacitor types with the visual inspection of a failed unit. Due to the limited suitability of PD threshold values for long-term operational assessment, the analysis is limited to relative comparison. Accordingly, the investigated type is compared with a reference capacitor of comparable design. The PD measurements confirm discharge activity in both capacitor types, with the investigated type exhibiting a greater number of higher-amplitude discharges than the reference. Analysis of PD characteristics suggests the presence of void- or surface-related discharges, supported by visual inspection of a failed capacitor in which voids in the resin insulation were identified. These findings are consistent with the PD behaviour and failure of the inspected unit and highlight the role of void-related defects in PD activity and insulation failure.
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