16–21 Aug 2026
Daejeon Convention Center
Asia/Seoul timezone

Beam extraction study of Kr and Xe Ions from 14.5 GHz ECR Ion Source at RAON

Not scheduled
2h
Daejeon Convention Center

Daejeon Convention Center

107 Expo-ro, Yuseong-gu, Daejeon (34125) South Korea
Poster Presentation MC1.A02 Electron and ion sources, guns, photo injectors, charge breeders Poster Session

Speaker

Dr Eunhun Im (Institute for Basic Science)

Description

The RAON 14.5 GHz ECR ion source has been used for beam conditioning and beamline commissioning with relatively lighter-mass ion beams such as Argon and Neon. As demand for beams with various A/q values has recently increased, the operational range of the ion source has needed to be extended to heavier noble gas beams such as krypton (Kr) and xenon (Xe). In ECR ion source operation, the extracted beam current and charge state distribution are affected by RF power, main and support gas injection conditions, bias disk conditions, and extraction parameters. In this study, Kr and Xe beam tuning was performed by varying these operating conditions while monitoring the extracted beam. These results provide operational reference data for the extraction of heavy noble gas beams from the RAON 14.5 GHz ECR ion source.

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Author

Dr Eunhun Im (Institute for Basic Science)

Co-authors

Hong Inseok (Institute for Basic Science) Jeongil Heo (Institute for Basic Science) Sukjin Choi (Institute for Basic Science)

Presentation materials

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