Speaker
Description
During the flight, spacecraft are constantly exposed to cosmic ionizing radiation. This radiation causes various types of radiation effects in on-board electronics. The most dangerous for modern electronics are single event effects from the impact of individual charged particles of galactic and solar cosmic rays. Charged particles accelerators are used to simulate the impact of heavy ions on electronic devices. Based on the requirements for the active lifetime of spacecraft, orbit and the probability of failure-free operation, the requirements for test facilities were determined and the most suitable type of accelerators are cyclotrons.
The Institute of Space Device Engineering (ISDE) and FLNR JINR have been cooperating for over 15 years in the field of creating single event effects test facilities, developing methodology for conducting tests and their dosimetry. Based on the U-400 and U-400M cyclotrons, FLNR JINR has created an infrastructure for irradiating electronic components with a set of heavy ions from C to Bi with energies from 3 to 40 MeV/A, which, together with the equipment available at the ISDE for setting and measuring the parameters of test objects, as well as their preliminary preparation, allows for a full cycle of testing any electronic components for space applications. The report presents a description of the test facilities and the testing process, the methods and devices used to determine the beam characteristics and metrological support for testing.
