Speaker
Description
ALBA is a 3rd generation synchrotron light source located in Barcelona, Spain, currently undergoing the design phase of its upgrade to the 4th generation, low-emittance machine ALBA II. Among the planned improvements, the upgrade foresees the installation of an active, normal-conducting (NC) harmonic RF system aimed at enhancing the beam lifetime. Discontinuities in the filling pattern, such as the ion-clearing gap, interrupt the homogeneous beam-loading build-up in the RF cavities, causing them to deliver different voltage values along the revolution period. This phenomenon, known as Transient Beam Loading (TBL), has significant consequences for the bunch-lengthening capabilities of the future double RF system of ALBA II.
In this contribution, we present a semi-analytical calculation of the TBL effect in ALBA II as a function of the gap in the filling pattern, together with a mitigation strategy to reduce its impact on the RF cavity voltage and its associated degradation of beam lifetime.
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