Speaker
Description
ALBA, a 3rd generation synchrotron light source in Barcelona, Spain, is currently preparing its upgrade to the 4th generation low emittance machine ALBA II. As part of this upgrade, an active normal conducting harmonic RF system will be installed to improve beam lifetime. However, discountinuities in the filling pattern, such as ion clearing gaps, induce RF cavity voltage variations along the revolution period. This effect, known as transient beam loading (TBL), severely degrades the bunch lengthening performance of the double RF system.
In this contribution, we present a semianalytical study of the TBL effect in ALBA II as a function of gap size, together with a mitigation strategy. The results show that, by modulating the power delivered to the main and harmonic RF cavities at the revolution frequency, the impact of TBL can be effectively mitigated, limiting the degradation of the bunch lengthening performance to 2–18% for gap lengths ranging from 2–11%.
| In which format do you inted to submit your paper? | LaTeX |
|---|---|
| Preprint marking on your proceeding paper | I do not wish my paper to be marked as preprint. |