Speaker
Description
A nanopatterned microbunching collaboration has been formed to test the production of electron microbunches by rotating transverse beamlets into the longitudinal plane using the emittance exchange (EEX) beamline of the Argonne Wakefield Accelerator (AWA).-* This mechanism has been suggested, such as by the Compact X-ray Free-Electron Laser (CXFEL) group at Arizona State University, to hold the potential to make short-wavelength free-electron lasers (FELs) more compact. Our collaboration will pattern AWA’s 40 MeV electron beam with a TEM grid to produce micro-scale beamlets that will become mico-to-nano scale microbunches in the longitudinal plane. Characterizing an array of beamlets with a modulation period at the few micron scale and a low, single pC scale total charge presents challenges in achieving the necessary transverse resolution and signal strength. These proceedings will detail the diagnostics explored to characterize these transverse modulations, including screens, slit-scans, wire-scans and grid-scans. We will discuss the merits and challenges of each approach in relation to our application, and progress towards demonstrating these desired diagnostics.
Funding Agency
This work is supported by the U. S. Department of Energy, under contract No. DE-AC02-06CH11357.
Footnotes
G. Ha et al., Nucl. Inst. and Methods A, vol. 1075, p. 170387, Jun. 2025.
*R. Margraf-O'Neal et al., Proc. NAPAC2025, Sacramento, CA, USA, pp. 173-176, Aug. 2025.
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