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Description
The SIRIUS is a fourth-generation Brazilian synchrotron light source whose high brilliance performance is determined by its low nominal electron beam emittance. The measurement of this parameter is crucial to validate the machine design, perform diagnostics, and guarantee beam quality for users. This work presents a methodology to measure the emittance at SIRIUS, combining spectral and spatial analysis of insertion device radiation. Three independent methods were applied: harmonic ratio, profile projection (peak-to-valley), and full 2D spatial profile minimization. Measurements were conducted simultaneously at the EMA (low beta section) and MANACA (high beta section) beamlines. The beta function, required for the final fitting, was measured with its uncertainty (≈ ±10%) incorporated into the analysis. The strategy aids in decoupling emittance from the ring's optical parameters with a certain level of confidence in the beta values. The results for the emittance are around 250-260 pm.rad, consistent with the design value, and demonstrate the effectiveness of the employed techniques. The study confirms the low emittance of SIRIUS and validates a set of methods for its continuous monitoring, advancing the knowledge on emittance measurement techniques.
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