17–22 May 2026
C.I.D
Europe/Zurich timezone

Determining an Inverse Compton X-ray Source’s Electron Beam Parameters from its X-ray Spectrum by Employing a Genetic Algorithm

THP2121
21 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC2.A26: Photon sources: Compton sources Poster session

Speaker

Benedikt Günther (Technical University of Munich)

Description

Compact Synchrotron X-ray sources can be realised by (inverse) Compton scattering of laser photons from a counterpropagating highly relativistic electron beam.
In the case of a bandwidth-limited picosecond laser, the X-ray spectrum’s shape is mainly influenced by the electron beam’s mean energy, its energy spread and emittance.
This fact can be used to determine these electron beam parameters with a genetic algorithm. The latter matches the modelled X-ray spectrum to the experimentally retrieved one, thereby retrieving the optimal electron beam parameters.
Since the main computational cost in this optimisation arises from modelling the X-ray spectrum for each set of laser and electron beam parameters, we developed an analytical physical model based on statistical arguments which reduces the time for the spectrum calculation significantly.
We present this model and demonstrate the feasibility of this approach at the Munich Compact Light Source*, a storage ring based inverse Compton X-ray source.

Footnotes

  • Eggl et al., Journal of Synchrotron Radiation 23, 1137-1142 (2016) & Guenther, Storage Ring-based Inverse Compton X-ray Sources, Springer Theses, Springer, ISBN 978-3-031-17741-5 (2023)

Funding Agency

Centre for Advanced Laser Applications (CALA), Deutsche Forschungsgemeinschaft (DFG, No. 513827659). B.T.: U.S. National Science Foundation CAREER No. 1847771; G.K.: Jefferson Science Associates, LLC

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Author

Benedikt Günther (Technical University of Munich)

Co-authors

Balsa Terzic (Old Dominion University) Eric Johnson (Old Dominion University) Geoffrey Krafft (Thomas Jefferson National Accelerator Facility) Johannes Melcher (Technical University of Munich) Martin Dierolf (Technical University of Munich)

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