Speaker
Description
Accurate characterization of high-order integrated multipoles in insertion devices (IDs) is essential to meet the stringent beam-dynamics requirements of the SLS 2.0. One effective approach is to extract these terms from transverse tune-shift measurements obtained while varying the beam trajectory through the ID. This technique provides a sensitive, in situ method to identify sextupole, octupole, and higher-order components under standard machine conditions, eliminating the need for dedicated magnetic measurements. The SLS 2.0 includes several types of IDs—planar, in-vacuum, and knot-type devices. Measurements show that all devices except the knot-type exhibit multipole content no higher than the sextupole order, whereas the knot-type ID presents significant contributions up to the octupole order. In this work, we focus on the knot-type device, which is planned for use at additional locations within the SLS 2.0 and at other synchrotrons undergoing similar modernization. We present different methods for varying the beam trajectory through the ID and discuss a detailed comparison between the corresponding measurements and simulation results.
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