Speaker
Description
Particle Induced X-ray Emission (PIXE) is a non-destructive analytical technique widely used for the precise identification of elemental compositions in materials. This project aims to develop a PIXE system utilizing the MC50 cyclotron beamline, designed to enhance analytical precision and versatility across a broad range of applications. The current infrastructure includes proton and neutron beam irradiation systems, a well-configured beamline, and a vacuum sample holder. A key focus of the development process is the precise control of proton beam energy to optimize elemental excitation and improve analysis accuracy. By tuning the proton energy, the system will provide enhanced detection capabilities for various elements while ensuring minimal interference from background signals. The integration of advanced detector alignment and beamline optimization is expected to enable efficient and reproducible elemental mapping. Once completed, the PIXE system will offer a robust platform for material analysis in areas such as environmental studies, cultural heritage preservation, and advanced material research. This project aims to establish a high-performance PIXE analysis system, advancing the potential of non-destructive elemental characterization for both academic and industrial applications.
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