17–22 May 2026
C.I.D
Europe/Zurich timezone

Analysis of Beam Loading Effect of Dark Current in C-Band Photocathode Electron Gun

TUP2697
19 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC2.T02: Photon sources: Electron Sources Poster session

Speaker

Shengjin LIU (China Spallation Neutron Source)

Description

In the research on high-gradient photocathode electron guns, the existence of dark current not only affects the measurement of photo-beam but also causes problems such as secondary electron multiplication and an increased difficult of condition. In this paper, the sources of dark current emission inside the electron gun and their impact duiring the power test are discussed through simulations. Additionally, combined with the test results from the C-band electron gun test platform in the pre-research project of the Southern Advanced Photon Source, the beam loading effect introduced by dark current is analyzed. The results show that when the dark current in the test is > 10 mA, it will increase the coupling parameters of the cavity and reduce the cathode accelerating field gradient.

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Authors

Shengjin LIU (China Spallation Neutron Source) Shimin Jiang (Institute of High Energy Physics) Dr Weilun Qin (Institute of High Energy Physics, Chinese Academy of Sciences) Xiao Li (Institute of High Energy Physics) Xingguang Liu (Chinese Academy of Sciences)

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