17–22 May 2026
C.I.D
Europe/Zurich timezone

Commissioning of the FERMI Electro-Optical System for time-resolved beam profile measurements

WEP6061
20 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Poster session

Speaker

Giovanni Campri (Elettra-Sincrotrone Trieste S.C.p.A.)

Description

The Electro-Optical Sampling (EOS) system uses the electro-optic effect to map the transient field of the beam onto a probe laser pulse, enabling direct reconstruction of the temporal current distribution.

Temporal profiles acquired with the EOS were compared with independent measurements from the RF deflector, used as the reference diagnostic. The two techniques show good agreement in pulse duration, peak position, and main temporal features, with minor differences attributed to their intrinsic resolution and coupling conditions. These results confirm that the EOS is fully operational and provides reliable time-domain diagnostics complementary to the deflector, non invasive and compatible with the operation

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Authors

Giovanni Campri (Elettra-Sincrotrone Trieste S.C.p.A.) Giuseppe Penco (Elettra-Sincrotrone Trieste S.C.p.A.)

Co-authors

Carlo Spezzani (Elettra-Sincrotrone Trieste S.C.p.A.) Marco Veronese (Elettra-Sincrotrone Trieste S.C.p.A.) Miltcho Danailov (Elettra-Sincrotrone Trieste S.C.p.A.) Paolo Cinquegrana (Elettra-Sincrotrone Trieste S.C.p.A.) Simone Spampinati (Elettra-Sincrotrone Trieste S.C.p.A.)

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