17–22 May 2026
C.I.D
Europe/Zurich timezone

Attosecond-Resolution Ultrafast Electron Diffraction Enabled by THz Streaking

TUP2690
19 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC2.A29: Ultrafast electron diffraction and ultrafast electron microscopy Poster session

Speaker

Jiapeng Li (Huazhong University of Science and Technology)

Description

Ultrafast electron diffraction (UED) enables atomic-scale structural imaging, yet achieving attosecond temporal resolution is limited by finite electron bunch durations and intrinsic pump–probe timing jitter. We propose a THz-streaking scheme that overcomes these limitations using a high-gradient (~1 GV/m) THz deflecting cavity. In this approach, THz fields streak a femtosecond diffraction pattern and map temporal evolution onto the detector’s spatial axis. This process enables attosecond-scale temporal information to be extracted in a single-shot measurement without requiring sub-femtosecond electron pulses. Preliminary simulations confirm its feasibility, demonstrating that attosecond temporal resolution can be decoupled from electron bunch duration and timing jitter, pushing streaking-based UED into the attosecond regime.

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Author

Jiapeng Li (Huazhong University of Science and Technology)

Co-authors

Yaodan Hu (Huazhong University of Science and Technology) Changda Peng (Huazhong University of Science and Technology) Cheng-Ying Tsai (Huazhong University of Science and Technology) Mr li zhengyan (Huazhong University of Science and Technology) Zhengzheng Liu (Huazhong University of Science and Technology) Jinfeng Yang (The University of Osaka) Kuanjun Fan (Huazhong University of Science and Technology)

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