Speaker
Description
Phase-Diversity Electro-Optic Sampling (DEOS) is an attractive non-destructive diagnostic for measuring the longitudinal current profile of relativistic electron bunches. It is particularly suited for characterizing a wide range of temporal durations. This method supports acquisition windows exceeding 10 ps for long bunches while preserving sensitivity to sub-picosecond structures. We are preparing an experiment to evaluate the capabilities of DEOS. We present an updated design that incorporates improved probe-beam synchronization and enhanced optical transport and dispersion management. The implementation of tailored longitudinal current profiles using the EEX beamline is discussed, along with the data-acquisition and reconstruction algorithms used for spectral-encoding retrieval.
| Paper status | No proceeding file submitted. |
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