17–22 May 2026
C.I.D
Europe/Zurich timezone

Preliminary Analysis of Transient Beam-Loading Effects in Electron Storage Rings with a 3rd Harmonic Cavity

THP5657
21 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC5.D05: Coherent and Incoherent Instabilities Theory, Simulations, Code Development Poster session

Speaker

Keon Hee Kim (Grand Accélérateur National d'Ions Lourds)

Description

In a 4th generation electron storage ring, harmonic cavities are often employed for increasing bunch length and beam lifetime. Effective bunch lengthening can be achieved when the first derivative
of total accelerating voltage is near zero. However, the accelerating voltage fluctuation due to transient beam-loading (TBL) effect can affect the bunch lengthening in the harmonic cavity system.
Therefore, we utilize both a Haissinski equation solver and a macroparticle tracking code to predict equilibrium beam distribution under TBL effects. The equilibrium longitudinal beam distributions
obtained from both approaches are presented and cross-validated for various fill patterns.

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Author

Taeyoon Lee (Korea University Sejong Campus)

Co-authors

Prof. Eun-San Kim (Korea University Sejong Campus) Keon Hee Kim (Grand Accélérateur National d'Ions Lourds)

Presentation materials

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