Speaker
Description
Accurate characterization of longitudinal properties in ultrashort electron bunches constitutes a fundamental prerequisite for advancing scientific applications of compact particle accelerators. Here, we present an on-chip integrated terahertz (THz)-driven dielectric particle deflector based on the inverse Cherenkov effect: by coherently illuminating a high-breakdown-threshold right-angle prism with two linearly polarized lasers featuring a 180° phase difference, synchronized evanescent waves are excited on the prism’s hypotenuse surface, enabling phase matching between particle velocity and wave velocity to generate sustained transverse deflection forces. This method successfully reconciles the inherent constraints of optical laser bunch length and radiofrequency input power, while achieving scalable temporal resolution from 10 femtoseconds to the attosecond regime. Simulation results validate that the proposed scheme provides a robust technical platform for on-chip longitudinal bunch diagnostics and particle manipulation, holding significant application prospects in electron bunch-based scientific facilities.
| Paper status | Resubmitted proceeding files received and assigned to an editor. Accepted. |
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