17–22 May 2026
C.I.D
Europe/Zurich timezone

Micro-fabricated photoconductive sampling devices for electron beam field measurements

MOP6369
18 May 2026, 16:00
2h
C.I.D

C.I.D

Deauville, France
Poster Presentation MC6.T03: Beam Diagnostics and Instrumentation Poster session

Speaker

Veronica Guo (Stanford University)

Description

Achieving high-precision, in situ measurements of electric fields is a critical challenge in ultrafast science and accelerator diagnostics. We report the progress in developing an approach using photoconductive sampling with micro-fabricated devices to map electron beam fields with unprecedented spatiotemporal resolution. This technique enables the first direct 3D vector field measurements of electron beams, offering valuable insights into collective effects such as coherent synchrotron radiation and other phenomena impacting beam quality. These low-cost, highly flexible devices present a pathway to enhancing our understanding of beam dynamics and reducing transient effects that degrade beam quality. The devices will be initially tested on the ultrafast X-ray beamline at LCLS, and could be adapted as a diagnostic tool across other SLAC user facilities. Beyond diagnostics, this approach will also help in advancing studies of ultrafast charge transport and unlocking new science in attosecond solid-state physics.

Funding Agency

This work was supported by US Department of Energy contract nos. DE-AC02-76SF00515, the DOE-BES Accelerator and detector research program, and DOE-BES, Chemical Sciences, Geosciences, and Biosciences.

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Author

Veronica Guo (Stanford University)

Co-authors

Agostino Marinelli (SLAC National Accelerator Laboratory) David Cesar (SLAC National Accelerator Laboratory) Sean OTool (Stanford University)

Presentation materials

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